312A5173P1 (Microcircuit Memory) by Bae Systems Controls Inc - Request a Quote Now

Part No. : 312A5173P1 Manufacturer : Bae Systems Controls Inc CAGE Code : 89954
Item Name : Microcircuit Memory FSC : 5962 Microcircuits Electronic NSN : 5962-01-303-8872

You can send a request for quote for p/n 312A5173P1 to ASAP Semiconductor using justpartsunlimited.com. This part is manufactured by Bae Systems Controls Inc (CAGE Code 89954). The description of it is Microcircuit Memory. The national stock number associated with this part is NSN 5962013038872. This part belongs to FSC Microcircuits Electronic part family. An associate from ASAP Semiconductor will respond within 15 minutes to your query. It is our pleasure to help you with 312A5173P1 part requirements.

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NSN Information for Part Number 312A5173P1 with NSN 5962-01-303-8872, 5962013038872

NSNFSCNIINCLSHazmatDEMILCancelled NSN
5962-01-303-8872

Item Description:

Microcircuit Memory

59620130388720NB
CIICHCCESDPMICCriticalityENAC
UBA0
Part NumberISCRNVCRNCCHCCMSDSSADC
312a5173p1523

Characteristics Data of NSN 5962-01-303-8872, 5962013038872

MRCCriteriaCharacteristic
ADAQBODY LENGTH2.370 INCHES MINIMUM AND 2.430 INCHES MAXIMUM
ADATBODY WIDTH0.550 INCHES MINIMUM AND 0.610 INCHES MAXIMUM
ADAUBODY HEIGHT0.040 INCHES MINIMUM AND 0.170 INCHES MAXIMUM
AEHXMAXIMUM POWER DISSIPATION RATING1.5 WATTS
AFGAOPERATING TEMP RANGE-55.0 TO 125.0 DEG CELSIUS
AFJQSTORAGE TEMP RANGE-65.0 TO 150.0 DEG CELSIUS
CBBLFEATURES PROVIDEDELECTROSTATIC SENSITIVE AND HERMETICALLY SEALED AND BURN IN AND STATIC OPERATION
CQSJINCLOSURE MATERIALCERAMIC
CQSZINCLOSURE CONFIGURATIONDUAL-IN-LINE
CWSGTERMINAL SURFACE TREATMENTSOLDER
CZENVOLTAGE RATING AND TYPE PER CHARACTERISTIC7.0 VOLTS MAXIMUM POWER SOURCE
CZEQTIME RATING PER CHACTERISTIC120.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 120.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
CZERMEMORY DEVICE TYPERAM
TTQYTERMINAL TYPE AND QUANTITY48 PRINTED CIRCUIT
CQWXOUTPUT LOGIC FORMCOMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
TESTTEST DATA DOCUMENT96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
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