CCC3250 (Delay Line) by M E Systems Of Texas Inc - Request a Quote Now

Part No. : CCC3250 Manufacturer : M E Systems Of Texas Inc CAGE Code : 59178
Item Name : Delay Line FSC : 5999 Miscellaneous Electrical and Electronic Components NSN : 5999-00-934-8740

You can send a request for quote for p/n CCC3250 to ASAP Semiconductor using justpartsunlimited.com. This part is manufactured by M E Systems Of Texas Inc (CAGE Code 59178). The description of it is Delay Line. The national stock number associated with this part is NSN 5999009348740. This part belongs to FSC Miscellaneous Electrical and Electronic Components part family. An associate from ASAP Semiconductor will respond within 15 minutes to your query. It is our pleasure to help you with CCC3250 part requirements.

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NSN Information for Part Number CCC3250 with NSN 5999-00-934-8740, 5999009348740

NSNFSCNIINCLSHazmatDEMILCancelled NSN
5999-00-934-8740

Item Description:

Delay Line

59990093487400P
CIICHCCESDPMICCriticalityENAC
7 A0
Part NumberISCRNVCRNCCHCCMSDSSADC
Ccc3250615

Characteristics Data of NSN 5999-00-934-8740, 5999009348740

MRCCriteriaCharacteristic
AAQLBODY STYLERECTANGULAR
ADAQBODY LENGTH0.850 INCHES NOMINAL
ADATBODY WIDTH0.250 INCHES NOMINAL
AFBHINDIVIDUAL SECTION QUANTITY1
AFGAOPERATING TEMP RANGE+0.0/+65.0 DEG CELSIUS
ANNQMATERIAL AND LOCATIONPLASTIC BODY
ANNRSURFACE TREATMENT AND LOCATIONANY ACCEPTABLE OVERALL
ANSLINPUT IMPEDANCE RATING250.000 OHMS
ANSROUTPUT IMPEDANCE RATING250.000 OHMS
APQLFREQUENCY BANDWIDTH18000.0 KILOHERTZ NOMINAL
ARBRBODY DEPTH0.265 INCHES NOMINAL
BZWMSIGNAL DELAY METHODLUMPED CONSTANT
CCDQSECTION DELAY TIME20.000 NANOSECONDS NOMINAL SINGLE SECTION
CCDXPULSE RISE TIME RATING10.0 NANOSECONDS
CCFFTERMINAL TYPE AND QUANTITY3 WIRE LEADS
TESTTEST DATA DOCUMENT81349-MIL-D-23859 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTI
ZZZVFSC APPLICATION DATAEXCEPT TESTING MULTIAPPLICATION
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