DM27C256-200 (Microcircuit Memory) by Seeq Technology Inc - Request a Quote Now

Part No. : DM27C256-200 Alternate P/N : DM27C256200 Manufacturer : Seeq Technology Inc
CAGE Code : 61394 Item Name : Microcircuit Memory FSC : 5962 Microcircuits Electronic
NSN : 5962-01-262-9858

You can send a request for quote for p/n DM27C256-200 to ASAP Semiconductor using justpartsunlimited.com. This part is manufactured by Seeq Technology Inc (CAGE Code 61394). The description of it is Microcircuit Memory. The national stock number associated with this part is NSN 5962012629858. This part belongs to FSC Microcircuits Electronic part family. An associate from ASAP Semiconductor will respond within 15 minutes to your query. It is our pleasure to help you with DM27C256-200 part requirements.

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NSN Information for Part Number DM27C256-200 with NSN 5962-01-262-9858, 5962012629858

NSNFSCNIINCLSHazmatDEMILCancelled NSN
5962-01-262-9858

Item Description:

Microcircuit Memory

59620126298580ND
CIICHCCESDPMICCriticalityENAC
7DA0
Part NumberISCRNVCRNCCHCCMSDSSADC
Dm27c256-200595

Characteristics Data of NSN 5962-01-262-9858, 5962012629858

MRCCriteriaCharacteristic
ADAQBODY LENGTH1.375 INCHES MAXIMUM
ADATBODY WIDTH0.500 INCHES MAXIMUM
ADAUBODY HEIGHT0.185 INCHES MAXIMUM
AEHXMAXIMUM POWER DISSIPATION RATING275.0 MILLIWATTS
AFGAOPERATING TEMP RANGE-55.0 TO 125.0 DEG CELSIUS
AFJQSTORAGE TEMP RANGE-65.0 TO 150.0 DEG CELSIUS
CBBLFEATURES PROVIDEDMONOLITHIC AND ULTRAVIOLET ERASABLE AND PROGRAMMABLE
CQSJINCLOSURE MATERIALMETAL OR CERAMIC OR PLASTIC
CQSZINCLOSURE CONFIGURATIONDUAL-IN-LINE
CQWXOUTPUT LOGIC FORMCOMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
CQZPINPUT CIRCUIT PATTERN23 INPUT
CTFTCASE OUTLINE SOURCE AND DESIGNATORD-10 MIL-M-38510
CWSGTERMINAL SURFACE TREATMENTSOLDER
CZENVOLTAGE RATING AND TYPE PER CHARACTERISTIC6.5 VOLTS MAXIMUM INPUT
CZERMEMORY DEVICE TYPEEPROM
TESTTEST DATA DOCUMENT96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
TTQYTERMINAL TYPE AND QUANTITY28 PRINTED CIRCUIT
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